Fringe Pattern Analysis for Optical Metrology (Hardcover)

Theory, Algorithms, and Applications

By Manuel Servin, J. Antonio Quiroga, Moises Padilla

Wiley-Vch, 9783527411528, 344pp.

Publication Date: August 18, 2014

List Price: 181.00*
* Individual store prices may vary.


About the Author

Manuel Servin received his engineering diploma from the ?cole Nationale Sup?rieure des T?l?communications in France (1982), and his Ph.D. from the Centro de Investigaciones en ?ptica A. C. (CIO) at Leon Mexico in 1994. He is co-author of the book `Interferogram Analysis for Optical Testing?. Dr. Servin has published more than 100 papers in scientific peer-reviewed journals on Digital Interferometry and Fringe Analysis. Juan Antonio Quiroga received his Ph.D. in physics in 1994 from the Universidad Complutense de Madrid, Spain. He is now teaching there at the Physics Faculty. His current principal areas of interest are Digital image processing applied to Optical Metrology and applied optics Moises Padilla is a Ph.D. student in optical sciences at the Centro de Investigaciones en ?ptica (CIO) at Le?n Mexico. He is associated with the optical metrology division of the CIO. His research activities are in digital signal processing and electrical communication engineering applied to processing and analysis of optical interferogram images.